• DocumentCode
    2198506
  • Title

    Investigation of the secondary arc current and the recovery voltage on a double-circuit transmission lines

  • Author

    Shang, Liqun ; Shi, Wei

  • Author_Institution
    Sch. of Electr. Eng., Xi´´an Jiaotong Univ., China
  • fYear
    2004
  • fDate
    10-10 June 2004
  • Firstpage
    1209
  • Abstract
    With the development of the power system, the double-circuit lines on the same pole are more and more widely used in a UHV (EHV) AC transmission system. Because of a coupling of the double-circuit lines, the values of the secondary arc current and recovery voltage on double-circuit lines are higher than that of the single-circuit lines. These will affect the possibility of successful single pole autoreclosing. The methods that reduce the magnitude of secondary arc current and recovery voltage should be used to ensure the successful autoreclosing. In this paper, the formulas of calculating the secondary arc current and the recovery voltage on double-circuit lines on the same pole are presented, and the factors affecting the secondary arc current and the recovery voltage are discussed. Using EMTP, calculated the secondary arc current and the recovery voltage of a double circuit lines on the same pole. The simulation results were in accordance with the theoretical analysis.
  • Keywords
    EMTP; arcs (electric); coupled transmission lines; poles and towers; power overhead lines; power transmission faults; EHV AC transmission system; EMTP; UHV AC transmission system; couplings; double-circuit transmission lines; electromagnetic transients program; recovery voltage; secondary arc current; single pole autoreclosing; single-circuit lines; Circuit faults; Coupling circuits; Distributed parameter circuits; Power system reliability; Power system stability; Power systems; Power transmission lines; Transmission line theory; Transmission lines; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Engineering Society General Meeting, 2004. IEEE
  • Conference_Location
    Denver, CO
  • Print_ISBN
    0-7803-8465-2
  • Type

    conf

  • DOI
    10.1109/PES.2004.1373046
  • Filename
    1373046