Title :
Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing
Author :
Hussin, Fawnizu Azmadi ; Yoneda, Tomokazu ; Fujiwara, Hideo
Author_Institution :
Nara Inst. of Sci. & Technol., Nara
Abstract :
In this paper, a new approach to NoC test scheduling based on bandwidth-sharing is presented. The test scheduling is performed under the objective of co-optimizing the wrapper area overhead and the resulting test application time using two complementary NoC wrappers. Experimental results showed that the area overhead can be optimized (to an extent) without compromising the test application time. Compared to other NoC scheduling approaches based on dedicated paths, our bandwidth sharing approach can reduce the test application time by up to 75.4%.
Keywords :
integrated circuit testing; network-on-chip; NoC reuse wrappers; bandwidth sharing; network-on-chip; test scheduling; test time co-optimization; Bandwidth; Cities and towns; Information science; Network-on-a-chip; Optimal control; Performance evaluation; Signal design; Testing; Transportation; Wires;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.22