• DocumentCode
    2198656
  • Title

    Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing

  • Author

    Hussin, Fawnizu Azmadi ; Yoneda, Tomokazu ; Fujiwara, Hideo

  • Author_Institution
    Nara Inst. of Sci. & Technol., Nara
  • fYear
    2007
  • fDate
    8-11 Oct. 2007
  • Firstpage
    459
  • Lastpage
    462
  • Abstract
    In this paper, a new approach to NoC test scheduling based on bandwidth-sharing is presented. The test scheduling is performed under the objective of co-optimizing the wrapper area overhead and the resulting test application time using two complementary NoC wrappers. Experimental results showed that the area overhead can be optimized (to an extent) without compromising the test application time. Compared to other NoC scheduling approaches based on dedicated paths, our bandwidth sharing approach can reduce the test application time by up to 75.4%.
  • Keywords
    integrated circuit testing; network-on-chip; NoC reuse wrappers; bandwidth sharing; network-on-chip; test scheduling; test time co-optimization; Bandwidth; Cities and towns; Information science; Network-on-a-chip; Optimal control; Performance evaluation; Signal design; Testing; Transportation; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Asian Test Symposium, 2007. ATS '07. 16th
  • Conference_Location
    Beijing
  • ISSN
    1081-7735
  • Print_ISBN
    978-0-7695-2890-8
  • Type

    conf

  • DOI
    10.1109/ATS.2007.22
  • Filename
    4388054