DocumentCode
2198656
Title
Area Overhead and Test Time Co-Optimization through NoC Bandwidth Sharing
Author
Hussin, Fawnizu Azmadi ; Yoneda, Tomokazu ; Fujiwara, Hideo
Author_Institution
Nara Inst. of Sci. & Technol., Nara
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
459
Lastpage
462
Abstract
In this paper, a new approach to NoC test scheduling based on bandwidth-sharing is presented. The test scheduling is performed under the objective of co-optimizing the wrapper area overhead and the resulting test application time using two complementary NoC wrappers. Experimental results showed that the area overhead can be optimized (to an extent) without compromising the test application time. Compared to other NoC scheduling approaches based on dedicated paths, our bandwidth sharing approach can reduce the test application time by up to 75.4%.
Keywords
integrated circuit testing; network-on-chip; NoC reuse wrappers; bandwidth sharing; network-on-chip; test scheduling; test time co-optimization; Bandwidth; Cities and towns; Information science; Network-on-a-chip; Optimal control; Performance evaluation; Signal design; Testing; Transportation; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.22
Filename
4388054
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