DocumentCode :
2198725
Title :
Block Marking and Updating Coding in Test Data Compression for SoC
Author :
Zhang, Lei ; Liang, Huaguo ; Zhan, Wenfa ; Jiang, Cuiyun
Author_Institution :
Hefei Univ. of Technol., Hefei
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
467
Lastpage :
472
Abstract :
A novel test data compression coding scheme, block marking and updating coding, is proposed in this paper. Test data in the test set was divided into successive fixed-length vectors, called blocks, and then they were marked according to their compatibility compared with a reference vector. An operation that is similar to difference and a technique that strategically fills in don ´t-care bits are combined to increase the probabilities of compatibility or inverse compatibility. It effectively compresses test data and its decompression structure is very simple. Experimental results of ISCAS-89 benchmark circuits show that the scheme is very effective.
Keywords :
automatic testing; data compression; decoding; integrated circuit testing; system-on-chip; ISCAS-89 benchmark circuits; SoC; block marking; decompression structure; test data compression; updating coding; Benchmark testing; Circuit testing; Decoding; Educational institutions; Encoding; Hardware; Test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.57
Filename :
4388056
Link To Document :
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