Title :
Block Marking and Updating Coding in Test Data Compression for SoC
Author :
Zhang, Lei ; Liang, Huaguo ; Zhan, Wenfa ; Jiang, Cuiyun
Author_Institution :
Hefei Univ. of Technol., Hefei
Abstract :
A novel test data compression coding scheme, block marking and updating coding, is proposed in this paper. Test data in the test set was divided into successive fixed-length vectors, called blocks, and then they were marked according to their compatibility compared with a reference vector. An operation that is similar to difference and a technique that strategically fills in don ´t-care bits are combined to increase the probabilities of compatibility or inverse compatibility. It effectively compresses test data and its decompression structure is very simple. Experimental results of ISCAS-89 benchmark circuits show that the scheme is very effective.
Keywords :
automatic testing; data compression; decoding; integrated circuit testing; system-on-chip; ISCAS-89 benchmark circuits; SoC; block marking; decompression structure; test data compression; updating coding; Benchmark testing; Circuit testing; Decoding; Educational institutions; Encoding; Hardware; Test data compression;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.57