Title :
Production Test of High Volume Commercial RFIC
Author :
Taenzler, Friedrich
Author_Institution :
Texas Instrum., Dallas
Abstract :
This presentation covers the motivations and constraints involved in multi-site testing of RF devices. A comprehensive list of these issues is documented in the following text.
Keywords :
production testing; radiofrequency integrated circuits; RF devices; RFIC; multi-site testing; production test; radiofrequency integrated circuits; Automatic testing; Constraint optimization; Cost function; Design optimization; Instruments; Life testing; Production; Radio frequency; Radiofrequency integrated circuits; Wireless LAN;
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
Print_ISBN :
978-0-7695-2890-8
DOI :
10.1109/ATS.2007.118
