DocumentCode :
2198934
Title :
Bluetooth Hopping BER Testing Methodologies on a Production Test Platform
Author :
Bement, David ; Karr, David
Author_Institution :
Broadcom Corp., Irvine
fYear :
2007
fDate :
8-11 Oct. 2007
Firstpage :
517
Lastpage :
517
Abstract :
Bluetooth devices are required to meet specific levels for Bit Error Rate (BER) performance. Two approaches to implementing a Bluetooth BER test with Frequency Hopping in a production ATE environment will be discussed.
Keywords :
Bluetooth; automatic test pattern generation; error statistics; frequency hop communication; production testing; ATE environment; BER; Bluetooth devices; bit error rate; frequency hopping; production test platform; Bandwidth; Bit error rate; Bluetooth; Frequency; Instruments; Microwave devices; Microwave theory and techniques; Modulation coding; Production; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location :
Beijing
ISSN :
1081-7735
Print_ISBN :
978-0-7695-2890-8
Type :
conf
DOI :
10.1109/ATS.2007.44
Filename :
4388067
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2198934
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