DocumentCode
2198934
Title
Bluetooth Hopping BER Testing Methodologies on a Production Test Platform
Author
Bement, David ; Karr, David
Author_Institution
Broadcom Corp., Irvine
fYear
2007
fDate
8-11 Oct. 2007
Firstpage
517
Lastpage
517
Abstract
Bluetooth devices are required to meet specific levels for Bit Error Rate (BER) performance. Two approaches to implementing a Bluetooth BER test with Frequency Hopping in a production ATE environment will be discussed.
Keywords
Bluetooth; automatic test pattern generation; error statistics; frequency hop communication; production testing; ATE environment; BER; Bluetooth devices; bit error rate; frequency hopping; production test platform; Bandwidth; Bit error rate; Bluetooth; Frequency; Instruments; Microwave devices; Microwave theory and techniques; Modulation coding; Production; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Asian Test Symposium, 2007. ATS '07. 16th
Conference_Location
Beijing
ISSN
1081-7735
Print_ISBN
978-0-7695-2890-8
Type
conf
DOI
10.1109/ATS.2007.44
Filename
4388067
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