DocumentCode
2199007
Title
High temperature superconducting microstrip resonators for the measurement of films made by pyrolysis
Author
de Melo, M.T. ; Lancaster, M.J. ; Yokota, H. ; Gough, C.E.
Author_Institution
Superconductivity Res. Group, Birmingham Univ., UK
Volume
2
fYear
1995
fDate
24-27 Jul 1995
Firstpage
868
Abstract
Microwave surface impedance measurements are reported for textured granular YBCO films made by a novel spray pyrolysis method on the surface of a YSZ substrate. A parallel plate resonator was formed by placing the film and substrate on top of a copper ground plane. Microwave measurements were made at nitrogen temperatures on the fundamental mode at ~4.7 GHz. A model has been developed to extract the penetration depth and impedance of the finite thickness granular film. We obtain values for penetration depth λg~3.6 μm and, using independent measurements of the critical current and grain size, a surface resistance Rg~13 mΩ
Keywords
electric resistance; electron device manufacture; high-temperature superconductors; microstrip resonators; microwave measurement; pyrolysis; superconducting device testing; superconducting microwave devices; superconducting resonators; superconducting thin films; 13 mohm; 3.6 micron; 4.7 GHz; SHF; Y2O3-ZrO2; YBaCuO; copper ground plane; critical current; films measurement; finite thickness granular film; fundamental mode; grain size; high temperature superconducting microstrip resonators; microwave surface impedance measurements; nitrogen temperatures; parallel plate resonator; penetration depth; spray pyrolysis method; substrate; surface resistance; textured granular YBCO films; Granular superconductors; High temperature superconductors; Land surface temperature; Microstrip resonators; Microwave theory and techniques; Substrates; Superconducting films; Superconducting microwave devices; Surface resistance; Surface texture;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location
Rio de Janeiro
Print_ISBN
0-7803-2674-1
Type
conf
DOI
10.1109/SBMOMO.1995.509729
Filename
509729
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