Title :
Characteristic propagation of the shielded high-Tc superconducting microstrip lines
Author :
Queiroz, I.S. ; da Costa, O.S.D. ; Fernandes, Humberto César Chaves
Author_Institution :
Dept. of Electr. Eng., Federal Univ. of Rio Grande do Norte, Natal, Brazil
Abstract :
The rigorous method in the spectral domain of the transverse transmission line (TTL) is used in the analysis of shielded microstrip lines considering the superconductor strip for the first time. Previously, the open superconductor microstrip line was considered by the authors and now they present the effects of the superconducting material in the strip in a shielded planar structure. The superconductor effect is included in this procedure using the complex resistive boundary conditions model. The surface impedance is related to the complex conductivity of the material that is calculated from an enhanced two-fluid model. Numerical results are presented for the propagation constant and normalized phase velocity as a function of the frequency and of the thickness of the strip for shielded superconductor microstrip lines and substrate with losses
Keywords :
cable sheathing; electric resistance; high-temperature superconductors; microstrip lines; planar waveguides; spectral-domain analysis; superconducting cables; superconducting microwave devices; superconducting thin films; waveguide theory; complex conductivity; complex resistive boundary conditions model; enhanced two-fluid model; frequency; losses; normalized phase velocity; numerical results; open superconductor microstrip line; propagation characteristics; propagation constant; shielded high-Tc superconducting microstrip lines; shielded planar structure; strip thickness; substrate; superconducting material; superconductor effect; superconductor strip; surface impedance; transverse transmission line; Boundary conditions; Conducting materials; Conductivity; Microstrip; Planar transmission lines; Propagation constant; Strips; Superconducting materials; Superconducting transmission lines; Surface impedance;
Conference_Titel :
Microwave and Optoelectronics Conference, 1995. Proceedings., 1995 SBMO/IEEE MTT-S International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-2674-1
DOI :
10.1109/SBMOMO.1995.509730
