Title :
Assessing and mapping crop vulnerability due to sudden cooling using time series satellite data
Author :
Dong, Yansheng ; Chen, Hongping ; Gu, Xiaohe ; Wang, Jihua ; Cui, Bei
Author_Institution :
Beijing Res. Center for Inf. Technol. in Agric., Beijing, China
Abstract :
Sudden cooling during the crop growing phase seriously impacts crop growth. Crop vulnerability to low temperature stress is affected both by crop growing condition and the lowest environmental temperature. In this study taking winter wheat in Huang-Huai-Hai Plain of China as an example, vulnerability index to low temperature stress was assessed based on time series satellite data in nearly ten years. Growth sensitivity of wheat-frost was quantified by vegetation index change between tillering stage before winter and shooting stage in the next year. Exposure index of wheat-frost was defined as lowest land surface temperature during critical growth period. Cluster analysis of crop mean vulnerability index showed that high vulnerability of wheat-frost located in central and northern of Hebei Province in nearly 10 years. The result will help to prevent frost damage of winter wheat.
Keywords :
atmospheric boundary layer; atmospheric temperature; crops; pattern clustering; statistical analysis; time series; vegetation mapping; China; Hebei province; Huang-Huai-Hai plain; cluster analysis; crop growing condition; crop growing phase; crop mean vulnerability index; crop vulnerability assessment; crop vulnerability mapping; environmental temperature; low temperature stress vulnerability index; sudden cooling; time series satellite data; wheat frost growth sensitivity; winter wheat; Agriculture; Cooling; Indexes; MODIS; Sensitivity; Stress; Temperature sensors; MODIS; Sudden cooling; frost; growth sensitivity; vulnerability;
Conference_Titel :
Geoscience and Remote Sensing Symposium (IGARSS), 2012 IEEE International
Conference_Location :
Munich
Print_ISBN :
978-1-4673-1160-1
Electronic_ISBN :
2153-6996
DOI :
10.1109/IGARSS.2012.6350797