Title :
Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems
Abstract :
The following topics were dealt with: basic mechanisms, radiation facilities; technology hardening; test methods and hardness assurance; experimental data and processing; single event effects; dosimetry and detectors; photonics and new technologies; in-flight data
Keywords :
dosimetry; integrated circuit testing; optical fibres; particle detectors; radiation effects; radiation hardening (electronics); semiconductor device testing; space vehicle electronics; detectors; dosimetry; hardness assurance; in-flight data; photonics; radiation effects; radiation facilities; single event effects; technology hardening; test methods;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon, France
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509742
