Low Effort Evaluation of Real-Time and Reliability Requirements for Embedded Systems

Measuring reliability of embedded systems is an important but non-trivial problem. In a system design process, it is desirable to have early indicators for the reliability of an embedded system. Such reliability measurement will typically be carried out on system prototypes. The reliability measurements should thus be easy in set up, flexible to system changes, and hopefully low in cost. In the paper we present a simple approach to do reliability tests for small-scale embedded systems. We explain our approach around a case study, but the method can easily be generalized. We discuss the advantages and disadvantages of our approach.