Title :
SPICE data base for neutron (1 MeV) radiation hardening design: permanent damage effects simulation of bipolar transistors
Author :
Rinaudo, O. ; Zimmer, T. ; Limtouch, S. ; Bourgoin, G. ; Lalande, P.
Author_Institution :
CEA, Centre d´´Etudes de Bruyeres-le-Chatel, France
Abstract :
This paper presents a methodology which predicts quite easily neutron irradiated SPICE model parameters for BJT´s. This methodolgy is based on both the well-known neutron irradiation theory and the SPICE model. It has been demonstrated that the impact of neutron irradiation can be described through a modification of the unirradiated SPICE parameters without changing the intrinsic SPICE model
Keywords :
SPICE; bipolar transistors; neutron effects; radiation hardening (electronics); semiconductor device models; 1 MeV; BJT; SPICE data base; bipolar transistors; intrinsic SPICE model; neutron irradiated SPICE model parameters; neutron irradiation theory; neutron radiation hardening design; permanent damage effects simulation; Bipolar transistors; Circuits; Degradation; Equations; Lattices; Neutrons; Predictive models; Radiation hardening; SPICE; Semiconductor materials;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509771
