Title :
The effects of radiation on identical devices with different types of packaging
Author :
Dowling, S. ; West, R.H.
Author_Institution :
R. Mil. Coll. of Sci., Cranfield Univ., Swindon, UK
Abstract :
NPN transistor structures taken from the same wafer of silicon have been packaged in different ways. The variation of their response to total dose has been investigated for different bias conditions
Keywords :
bipolar transistors; elemental semiconductors; radiation effects; semiconductor device packaging; semiconductor device testing; silicon; NPN transistor structures; Si; bias conditions; elemental semiconductors; packaging; radiation effects; total dose; Ceramics; Circuit testing; Degradation; Educational institutions; Geometry; Manufacturing; Passivation; Plastic packaging; Radiation monitoring; Silicon;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509784
