• DocumentCode
    2200420
  • Title

    Effect of machining on dielectrical and mechanical properties of ceramics

  • Author

    Bigarre, J. ; Fayeulle, S. ; Jardin, C. ; Le Gressus, C.

  • Author_Institution
    Ecole Centrale de Lyon, Ecully, France
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    425
  • Abstract
    Machining effects have been studied on model materials (pure single crystals of Al2O3) by different surface preparations: soft polishing (friction) and hard polishing (grinding and diamond polishing). Characterization of point defects created by machining is investigated by cathodoluminescence. Dielectrical ability to form a space charge and the stability of trapped charges is studied by the mirror method recently developed. Mechanical properties are characterized by toughness and friction test. The influence of heat treatments to restore the crystal lattice or to stabilize point defects is also studied in the same experimental methodology. Polishing is associated to the formation of oxygen vacancies which can trap electrons under electronic irradiation. Thermal treatments decrease the charge trapping ability and modify the surrounding of oxygen vacancies. The effect of friction is also discussed in comparison with the polishing results
  • Keywords
    alumina; electric breakdown; heat treatment; insulation testing; machining; materials testing; mechanical properties; polishing; surface treatment; Al2O3; cathodoluminescence; ceramics; diamond polishing; dielectric properties; dielectrical ability; electronic irradiation; friction; grinding; hard polishing; heat treatment; insulation breakdown testing; machining effects; mechanical properties; mirror method; oxygen vacancies; point defects characterisation; soft polishing; space charge; surface preparation; toughness; trapped charges stability; Crystalline materials; Crystals; Dielectric devices; Dielectric materials; Electron traps; Friction; Machining; Mechanical factors; Space charge; Stability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545395
  • Filename
    545395