Title :
Radiation tests on BCD100 smart power technology
Author :
Tastet, Pierre ; Garnier, Jerome ; Garraud, Laurent ; Chabannes, Patrice ; David, Jean Pierre ; Millan, Philippe
Author_Institution :
CNES, Toulouse, France
Abstract :
Since BCD100 Smart Power technology may be of interest for space applications, we have characterized the TSXKFC481A test vehicle under radiation (total dose and heavy ions)
Keywords :
BiCMOS integrated circuits; gamma-ray effects; integrated circuit testing; ion beam effects; ion beams; power integrated circuits; space vehicle electronics; BCD100 smart power technology; BiCMOS; TSXKFC481A test vehicle; gamma rays; heavy ions; radiation tests; space applications; total dose; Bipolar transistors; Circuit testing; Light emitting diodes; Logic functions; Logic testing; Low voltage; MOSFETs; Protection; Space technology; Vehicles;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509791
