Title :
SEU and latch-up results on transputers
Author :
Bezerra, F. ; Velazco, R. ; Assoum, A. ; Benezech, D.
Author_Institution :
CNES, Toulouse, France
Abstract :
IMST805 and IMST225 transputers are being considered for space applications. In a view to predict their in orbit behaviour, their sensitivity to single event phenomena has been evaluated under heavy ion irradiation
Keywords :
aerospace computing; computer testing; integrated circuit testing; ion beam effects; space vehicle electronics; special purpose computers; transputers; IMST225; IMST805; SEU sensitivity; heavy ion irradiation; in orbit behaviour prediction; latchup sensitivity; single event phenomena; single event upset; space applications; transputers; Cache memory; Circuit testing; Computer architecture; Microprocessors; Production; Read-write memory; Registers; Single event upset; System testing; Test equipment;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509800
