Title :
Transverse line parameters of coupled microstrips on a lossy substrate
Author :
Assante, Dario ; Verolino, Luigi
Author_Institution :
Department of Electrical Engineering, University of Naples ¿Federico II¿, Via Claudio 21, I-80123 Napoli, Italy
Abstract :
This paper deals with the evaluation of the frequencydependent transverse line parameters C and G of coupled microstrips on a lossy substrate. The proposed full wave approach, combined with the use of the Neumann series, allows a simple and fast computing solution of the problem and accurately takes into account the proximity effect between the microstrips. The method can also be useful for the validation of simple closed-form expressions.
Keywords :
Circuit simulation; Closed-form solution; Conductivity; Current density; Frequency; Geometry; Integrated circuit interconnections; Microstrip; Proximity effect; Solid modeling;
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC Zurich 2007. 18th International Zurich Symposium on
Conference_Location :
Munich, Germany
Print_ISBN :
978-3-9523286-1-3
Electronic_ISBN :
978-3-9523286-0-6
DOI :
10.1109/EMCZUR.2007.4388256
