DocumentCode
2201100
Title
Total dose responses of Actel 1020B and 1280A field programmable gate arrays (FPGAs)
Author
Katz, Richard ; Swift, Gary ; Shaw, David
Author_Institution
NASA Goddard Space Flight Center, Greenbelt, MD, USA
fYear
1995
fDate
18-22 Sep 1995
Firstpage
412
Lastpage
419
Abstract
Gamma irradiation and annealing of a large number of Actel FPGAs with in-situ current measurements were performed. Lot-to-lot, part-to-part, and burn in variations were measured. Findings include a catastrophic failure mechanism and minimal dose rate effects
Keywords
annealing; field programmable gate arrays; gamma-ray effects; 1020B; 1280A; Actel FPGA; annealing; burn in; catastrophic failure; field programmable gate array; gamma irradiation; in-situ current measurement; lot-to-lot variations; part-to-part variations; total dose response; Circuit testing; Field programmable gate arrays; Integrated circuit interconnections; Laboratories; Logic devices; Manufacturing; NASA; Programmable logic arrays; Propulsion; Space technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location
Arcachon
Print_ISBN
0-7803-3093-5
Type
conf
DOI
10.1109/RADECS.1995.509812
Filename
509812
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