DocumentCode :
2201272
Title :
Switching-current measurement for multiple ICs sharing a common power island structure
Author :
Li, Liang ; Hwang, Chulsoon ; Wang, Tao ; Takita, Yuzo ; Takeuchi, Hayato ; Araki, Kenji ; Fan, Jun
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear :
2012
fDate :
6-10 Aug. 2012
Firstpage :
560
Lastpage :
564
Abstract :
Switching currents in active integrated circuits (ICs) generate noise in the power distribution network (PDN), which is one of the main sources for many signal/power integrity and electromagnetic interference issues in high-speed electronic devices. Accurate knowledge of the switching currents is the key to ensure a good PDN design. This paper proposes a measurement methodology, when IC information is not available, to obtain the equivalent switching current of each IC in the case where multiple ICs are connected to a common power island structure. Time-domain oscilloscope measurements are used to capture the noise-voltage waveforms at a few locations in the power island. Combining with the multi-port frequency-domain S-parameter measurement among the same locations, an equivalent switching current for each IC is calculated. The proposed method is validated at a different location in the power island by comparing the calculated noise voltage using the equivalent switching currents as excitations with the actual measured noise voltage.
Keywords :
S-parameters; electric current measurement; electromagnetic interference; integrated circuit measurement; oscilloscopes; PDN design; active integrated circuits; common power island structure; electromagnetic interference; high-speed electronic devices; multiple IC; multiport frequency-domain S-parameter measurement; noise voltage; noise-voltage waveforms; power distribution network; switching-current measurement; time-domain oscilloscope measurements; Current measurement; Integrated circuits; Noise; Noise measurement; Switches; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location :
Pittsburgh, PA
ISSN :
2158-110X
Print_ISBN :
978-1-4673-2061-0
Type :
conf
DOI :
10.1109/ISEMC.2012.6350932
Filename :
6350932
Link To Document :
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