• DocumentCode
    2201272
  • Title

    Switching-current measurement for multiple ICs sharing a common power island structure

  • Author

    Li, Liang ; Hwang, Chulsoon ; Wang, Tao ; Takita, Yuzo ; Takeuchi, Hayato ; Araki, Kenji ; Fan, Jun

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2012
  • fDate
    6-10 Aug. 2012
  • Firstpage
    560
  • Lastpage
    564
  • Abstract
    Switching currents in active integrated circuits (ICs) generate noise in the power distribution network (PDN), which is one of the main sources for many signal/power integrity and electromagnetic interference issues in high-speed electronic devices. Accurate knowledge of the switching currents is the key to ensure a good PDN design. This paper proposes a measurement methodology, when IC information is not available, to obtain the equivalent switching current of each IC in the case where multiple ICs are connected to a common power island structure. Time-domain oscilloscope measurements are used to capture the noise-voltage waveforms at a few locations in the power island. Combining with the multi-port frequency-domain S-parameter measurement among the same locations, an equivalent switching current for each IC is calculated. The proposed method is validated at a different location in the power island by comparing the calculated noise voltage using the equivalent switching currents as excitations with the actual measured noise voltage.
  • Keywords
    S-parameters; electric current measurement; electromagnetic interference; integrated circuit measurement; oscilloscopes; PDN design; active integrated circuits; common power island structure; electromagnetic interference; high-speed electronic devices; multiple IC; multiport frequency-domain S-parameter measurement; noise voltage; noise-voltage waveforms; power distribution network; switching-current measurement; time-domain oscilloscope measurements; Current measurement; Integrated circuits; Noise; Noise measurement; Switches; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
  • Conference_Location
    Pittsburgh, PA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4673-2061-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2012.6350932
  • Filename
    6350932