DocumentCode
2201272
Title
Switching-current measurement for multiple ICs sharing a common power island structure
Author
Li, Liang ; Hwang, Chulsoon ; Wang, Tao ; Takita, Yuzo ; Takeuchi, Hayato ; Araki, Kenji ; Fan, Jun
Author_Institution
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2012
fDate
6-10 Aug. 2012
Firstpage
560
Lastpage
564
Abstract
Switching currents in active integrated circuits (ICs) generate noise in the power distribution network (PDN), which is one of the main sources for many signal/power integrity and electromagnetic interference issues in high-speed electronic devices. Accurate knowledge of the switching currents is the key to ensure a good PDN design. This paper proposes a measurement methodology, when IC information is not available, to obtain the equivalent switching current of each IC in the case where multiple ICs are connected to a common power island structure. Time-domain oscilloscope measurements are used to capture the noise-voltage waveforms at a few locations in the power island. Combining with the multi-port frequency-domain S-parameter measurement among the same locations, an equivalent switching current for each IC is calculated. The proposed method is validated at a different location in the power island by comparing the calculated noise voltage using the equivalent switching currents as excitations with the actual measured noise voltage.
Keywords
S-parameters; electric current measurement; electromagnetic interference; integrated circuit measurement; oscilloscopes; PDN design; active integrated circuits; common power island structure; electromagnetic interference; high-speed electronic devices; multiple IC; multiport frequency-domain S-parameter measurement; noise voltage; noise-voltage waveforms; power distribution network; switching-current measurement; time-domain oscilloscope measurements; Current measurement; Integrated circuits; Noise; Noise measurement; Switches; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2012 IEEE International Symposium on
Conference_Location
Pittsburgh, PA
ISSN
2158-110X
Print_ISBN
978-1-4673-2061-0
Type
conf
DOI
10.1109/ISEMC.2012.6350932
Filename
6350932
Link To Document