Title :
Improvement of algorithms for on-line interdigital dielectrometry measurement of material properties
Author :
Mamishev, A.V. ; Lin, C. ; Du, Y. ; Lesieutre, B.C. ; Zahn, M.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., MIT, Cambridge, MA, USA
Abstract :
Interdigital frequency-wavenumber dielectrometry is useful for a variety of industrial applications where standard parallel plate measurements are either impossible or do not provide sufficient information about the studied dielectric. This paper describes a practical model based approach to the estimation of physical parameters through one-side access measurement of dielectric properties of solid and liquid insulators. The focus of this study is improvement of the speed, precision, and reliability of previously developed algorithms. The inverse problem of material parameter estimation is solved through interpolation of the parametric sweeps of the variables of interest. As a result, the need for a computationally expensive iterative solution of the forward problem is eliminated
Keywords :
dielectric measurement; interpolation; parameter estimation; algorithm; dielectric properties; industrial application; interpolation; liquid insulator; material parameter estimation; model; on-line interdigital frequency-wavenumber dielectrometry measurement; solid insulator; Dielectric liquids; Dielectric materials; Dielectric measurements; Dielectrics and electrical insulation; Frequency measurement; Inverse problems; Iterative algorithms; Measurement standards; Parameter estimation; Solid modeling;
Conference_Titel :
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location :
Arlington, VA
Print_ISBN :
0-7803-4927-X
DOI :
10.1109/ELINSL.1998.694829