DocumentCode
2201506
Title
On the interaction between the DUT’s radar cross section and the reactive effect of TEM cells
Author
Pouhè, David ; Mönich, Gerhard
Author_Institution
Technical University Berlin, Einsteinufer 25, 10587 Berlin, Germany
fYear
2007
fDate
24-28 Sept. 2007
Firstpage
413
Lastpage
416
Abstract
A simple novel approach for an efficient investigation of the interactions between the DUT and the cell is provided. Closed-form expressions for the reflection coefficient, the relative deviation in field and the relative error in induced current caused by the reactive effect of the cell are derived. Each of these expressions encompasses both the mutual influence of the DUT’s RCS and the reactive effect of the cell. It is shown that, depending on the frequency dependent phase factor ejͨ, strong and weak test conditions may occur since the overall incident field will exhibit maxima and minima. Hence evidence showing that the total incident field impinging on the DUT generally deviates from the primary excited TEM field is provided.
Keywords
Closed-form solution; Electromagnetic compatibility; Frequency dependence; Lighting; Propagation delay; Radar cross section; Reflection; Shape; TEM cells; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2007. EMC Zurich 2007. 18th International Zurich Symposium on
Conference_Location
Munich, Germany
Print_ISBN
978-3-9523286-1-3
Electronic_ISBN
978-3-9523286-0-6
Type
conf
DOI
10.1109/EMCZUR.2007.4388283
Filename
4388283
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