• DocumentCode
    2201513
  • Title

    Effects related to dose deposition profiles in integrated optics structures

  • Author

    West, R.H. ; Dowling, S.

  • Author_Institution
    R. Mil. Coll. of Sci., Shrivenham, UK
  • fYear
    1995
  • fDate
    18-22 Sep 1995
  • Firstpage
    519
  • Lastpage
    524
  • Abstract
    Results from exposures of lithium tantalate and lithium niobate integrated optic structures to pulses of high energy X-rays and fast electrons are related to dose and charge deposition profiles. Anomalous effects in the tantalate are ascribed to induced electric fields
  • Keywords
    X-ray effects; electron beam effects; integrated optics; lithium compounds; optical losses; LiNbO3; LiTaO3; charge deposition profiles; dose deposition profiles; fast electrons; high energy X-rays; induced electric fields; integrated optics structures; Electron optics; Integrated optics; Lithium niobate; Optical losses; Optical materials; Optical refraction; Optical scattering; Optical variables control; Optical waveguides; X-rays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
  • Conference_Location
    Arcachon
  • Print_ISBN
    0-7803-3093-5
  • Type

    conf

  • DOI
    10.1109/RADECS.1995.509831
  • Filename
    509831
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2201513