A detailed study on high-voltage capacitor dielectric system under multistress conditions

Author

Krishna Moorthy, P.A. ; Varughese, J.

Author_Institution

Div. of Insulation, Electr. Res. & Dev. Assoc., Vadodara, India

Volume

2

fYear

1998

fDate

7-10 Jun 1998

Firstpage

456

Abstract

This paper presents the results of a detailed study conducted using model capacitors and dielectric film to estimate the service life and the interaction behaviour of film and the impregnant. Model capacitors were prepared using films procured from different sources and subjected to accelerated ageing. The working life of HT capacitors at 25°C and 50 volts/micron stress is found to be above 30 years. The effect of temperature on the design of the model capacitor is discussed. A relatively new short-term technique of life estimation of film by continuous constant stress application has been studied. A new phenomenon of the formation of liquid-droplets on the film surface in this test was observed. The causes for this are discussed

Keywords

ageing; dielectric thin films; life testing; power capacitors; 25 C; HT capacitor; accelerated multistress ageing; continuous constant stress; dielectric film; high voltage capacitor; impregnant; liquid droplet; service life; temperature effect; Accelerated aging; Capacitors; Conductive films; Dielectrics and electrical insulation; Life estimation; Life testing; Optical films; Petroleum; Polymer films; Stress;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on

Conference_Location

Arlington, VA

ISSN

1089-084X

Print_ISBN

0-7803-4927-X

Type

conf

DOI

10.1109/ELINSL.1998.694832

Filename

694832