Upsets in the Freja Magnetic Field Experiment

Author

Kinnison, James D.

Author_Institution

Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA

fYear

1995

fDate

18-22 Sep 1995

Firstpage

589

Lastpage

592

Abstract

Several methods exist for estimating single event and proton upset rates based on ground test data. The accuracy of these methods is crucial to successfully designing spacecraft systems. This paper presents flight upset data from static RAMS used in the Freja Magnetic Field Experiment and compares the flight data to estimates generated by commonly used methods. The flight data is also used to test common assumptions about the variability of the orbital environment

Keywords

SRAM chips; atmospheric techniques; geomagnetism; magnetic field measurement; proton effects; space vehicle electronics; Freja Magnetic Field Experiment; flight data; ground test data; orbital environment; proton upsets; single event upsets; spacecraft system design; static RAM; Central Processing Unit; Extraterrestrial measurements; Geomagnetism; Magnetic field measurement; Magnetic fields; Magnetic sensors; Plasma measurements; Protons; Space vehicles; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on

Conference_Location

Arcachon

Print_ISBN

0-7803-3093-5

Type

conf

DOI

10.1109/RADECS.1995.509841

Filename

509841

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2201740