Title :
Upsets in the Freja Magnetic Field Experiment
Author :
Kinnison, James D.
Author_Institution :
Appl. Phys. Lab., Johns Hopkins Univ., Laurel, MD, USA
Abstract :
Several methods exist for estimating single event and proton upset rates based on ground test data. The accuracy of these methods is crucial to successfully designing spacecraft systems. This paper presents flight upset data from static RAMS used in the Freja Magnetic Field Experiment and compares the flight data to estimates generated by commonly used methods. The flight data is also used to test common assumptions about the variability of the orbital environment
Keywords :
SRAM chips; atmospheric techniques; geomagnetism; magnetic field measurement; proton effects; space vehicle electronics; Freja Magnetic Field Experiment; flight data; ground test data; orbital environment; proton upsets; single event upsets; spacecraft system design; static RAM; Central Processing Unit; Extraterrestrial measurements; Geomagnetism; Magnetic field measurement; Magnetic fields; Magnetic sensors; Plasma measurements; Protons; Space vehicles; Testing;
Conference_Titel :
Radiation and its Effects on Components and Systems, 1995. RADECS 95., Third European Conference on
Conference_Location :
Arcachon
Print_ISBN :
0-7803-3093-5
DOI :
10.1109/RADECS.1995.509841
