DocumentCode :
2201773
Title :
Handling KDD process iteration by integration of planning and controlling
Author :
Liu, Chunnian ; Zhong, Ning
Author_Institution :
Dept. of Comput. Sci., Beijing Polytech. Univ., China
Volume :
1
fYear :
1998
fDate :
11-14 Oct 1998
Firstpage :
411
Abstract :
In our GLS (global learning scheme) system, KDD (knowledge discovery in databases) process is modeled as an organized society of intelligent agents (called KDD agents). KDD process planning is a meta-agent in this framework, and some basic AI planning techniques have been used to organize dynamically the KDD process so that the GLS system increases both autonomy and versatility. In this paper, we address some deeper issues concerning KDD process planning. Especially we propose a mechanism integrating process planning with process controlling to formalize process iteration (that is, the re-execution of some agents). In this mode, execution failures causing process iteration, feedback paths and re-execution of the agents in the paths (and even the iterating number for each loop) are determined dynamically and automatically. With this and other deeper issues (such as process evolution) being properly handled, the GLS system is more complete in KDD process modeling, and more flexible and robust for practical use.
Keywords :
data mining; database management systems; feedback; iterative methods; multi-agent systems; planning (artificial intelligence); system recovery; AI planning techniques; GLS; KDD agents; KDD process iteration handling; KDD process planning; agent re-execution; control; databases; execution failures; feedback paths; global learning scheme; knowledge discovery; meta-agent; organized intelligent agent society; process evolution; process iteration; Artificial intelligence; Automatic control; Control systems; Databases; Feedback loop; Intelligent agent; Process control; Process planning; Production systems; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
ISSN :
1062-922X
Print_ISBN :
0-7803-4778-1
Type :
conf
DOI :
10.1109/ICSMC.1998.725446
Filename :
725446
Link To Document :
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