DocumentCode :
2201936
Title :
Detecting temporal patterns using Reconstructed Phase Space and Support Vector Machine in the dynamic data system
Author :
Zhang, Wenjing ; Feng, Xin ; Bansal, Naveen
Author_Institution :
Dept. of Electr. & Comput. Eng., Marquette Univ., Milwaukee, WI, USA
fYear :
2011
fDate :
6-8 June 2011
Firstpage :
209
Lastpage :
214
Abstract :
In this paper we present a method for detecting dynamic temporal patterns that are characteristic and predictive of significant events in a dynamic data system. We employ the Gaussian Mixture Model (GMM) to cluster the data sequence into three categories of signals, e.g. normal, patterns and events. The data sequence is then embedded into a Reconstructed Phase Space (RPS) which is topologically equivalent to the dynamics of the original system. We apply a hybrid method using Support Vector Machines (SVM) and Maximum a Posterior (MAP) to classify temporal pattern signals based on the event function. We performed two experimental applications using chaotic time series and Sludge Volume Index (SVI) series related to the Sludge Bulking problem. The proposed hybrid GMM-SVM phase space approach effectively detects temporal patterns and achieves higher predictive accuracy compared with the original RPS framework.
Keywords :
Gaussian processes; maximum likelihood estimation; pattern classification; phase space methods; support vector machines; time series; GMM-SVM phase space approach; Gaussian mixture model; RPS framework; chaotic time series; data sequence cluster; dynamic data system; maximum a posterior algorithm; reconstructed phase space; sludge bulking problem; sludge volume index series; support vector machine; temporal pattern detection; Accuracy; Data models; Indexes; Noise; Nonlinear dynamical systems; Support vector machines; Training; Dynamic Data Systems; Gaussian Mixture Model; Reconstructed Phase Space; Support Vector Machine; Temporal Pattern Detection;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Information and Automation (ICIA), 2011 IEEE International Conference on
Conference_Location :
Shenzhen
Print_ISBN :
978-1-4577-0268-6
Electronic_ISBN :
978-1-4577-0269-3
Type :
conf
DOI :
10.1109/ICINFA.2011.5948989
Filename :
5948989
Link To Document :
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