DocumentCode :
2201940
Title :
Measurement Errors Caused by the Transient Limiter
Author :
Williams, Tim
Author_Institution :
Elmac Services, Wareham, United Kingdom
fYear :
2007
fDate :
24-28 Sept. 2007
Firstpage :
493
Lastpage :
496
Abstract :
The standard conducted emissions test may use a transient limiter between the LISN and the measuring instrumentation. This component is non-linear and can introduce significant errors in the measurement, sufficient to completely change the outcome of the test but which are transparent to the test engineer. The different mechanisms by which this may happen are described and modelled, and some mitigation techniques are recommended.
Keywords :
Attenuation; Clamps; Diodes; Impedance; Instruments; Measurement errors; Protection; Radio frequency; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2007. EMC Zurich 2007. 18th International Zurich Symposium on
Conference_Location :
Munich, Germany
Print_ISBN :
978-3-9523286-1-3
Electronic_ISBN :
978-3-9523286-0-6
Type :
conf
DOI :
10.1109/EMCZUR.2007.4388303
Filename :
4388303
Link To Document :
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