Title :
Electrical properties of plasmas formed in explosive magnetic flux compression generator environments
Author :
Dorsey, D.J. ; Freeman, B.L.
Author_Institution :
Texas A&M Univ., College Station, TX, USA
Abstract :
Summary form only given. Explosively driven shock tubes are used to study shock induced gas conductivity in explosive magnetic flux compression generators (FCGs). The shock tubes use 50 grams of composition C-4 explosive to propel aluminum flyer plates towards dense stainless steel plugs to simulate gas compression as the armature approaches the stator in an FCG. The 2.5 cm ID acrylic shock tubes are designed using the Gurney method to drive the flyer plates at velocities similar to FCG armatures (3-4 km/s). Experiments have been performed with argon, helium, synthetic air, and sulfur hexafluoride. Current and voltage measurements have been used to determine plasma bulk resistance as a function of time. Minimum resistances of 2.7 Ohms in argon and 6.5 Ohms in SF/sub 6/ were measured. These measurements were used to calculate minimum plasma resistivities of 0.031 Ohm/spl middot/cm for argon and 0.073 Ohm/spl middot/cm for SF/sub 6/. Calculations are based on experimental geometry and the assumption of a finite plasma disk between current and voltage probes.
Keywords :
magnetic flux; plasma diagnostics; plasma production; plasma transport processes; pulse generators; pulsed power supplies; shock tubes; 2.7 ohm; 3 to 4 km/s; 6.5 ohm; Ar; Gurney method; He; SF/sub 6/; acrylic shock tubes; aluminum flyer plates; composition C-4 explosive; current measurements; current probes; dense stainless steel plugs; electrical properties; explosive magnetic flux compression generator environments; explosive magnetic flux compression generators; explosively driven shock tubes; finite plasma disk; flyer plates; gas compression; minimum plasma resistivities; minimum resistances; plasma bulk resistance; plasma formation; shock induced gas conductivity; stator; voltage measurements; voltage probes; Argon; Conductivity; Electric shock; Electrical resistance measurement; Explosives; Magnetic flux; Magnetic properties; Plasma density; Plasma measurements; Plasma properties;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854721