• DocumentCode
    2202046
  • Title

    A design for a multipactor experiment on a dielectric surface

  • Author

    Anderson, R. ; Getty, W. ; Lau, Y.Y. ; Brake, M.L. ; Valfells, A. ; Gilgenbach, R.M.

  • Author_Institution
    Intense Energy Beam Interaction Lab., Michigan Univ., Ann Arbor, MI, USA
  • fYear
    2000
  • fDate
    4-7 June 2000
  • Firstpage
    115
  • Abstract
    Summary form only given, as follows. A novel experiment for single surface multipactor on a dielectric surface is underway at the University of Michigan. The simulations that lead to the design of the experiment will be presented along with some preliminary calculations. The emphasis is on the susceptibility of multipactor discharge and its subsequent loading of the cavity modes. The experiment consists of a small brass microwave cavity in a high vacuum system. The dimensions of the cavity are /spl sim/15 cm in length with an outer diameter of /spl sim/10 cm. A pulsed microwave source at /spl sim/2.5 GHz delivers up to 5 kW peak power to the cavity. The microwaves excite the TE111 mode so that there is a strong electric field parallel to the dielectric surface. The Hewlett Packard HFSS code is used to model the fields and helped determine the optimal positioning of the dielectric and verified that the TE111 mode resonated with only a slight change in resonant frequency. The power supply is frequency adjustable. Micro-coax will be used to probe the fields and a collector probe and photodiode will be used to identify the multipactor.
  • Keywords
    dielectric materials; microwave switches; simulation; surface discharges; 2.5 GHz; 5 kW; Hewlett Packard HFSS code; Micro-coax; TE111 mode; brass microwave cavity; cavity modes loading; collector probe; dielectric surface; high vacuum system; multipactor discharge susceptibility; multipactor experiment; photodiode; pulsed microwave source; simulations; Dielectrics; Fault location; Photodiodes; Power supplies; Probes; Resonant frequency; Surface discharges; US Department of Energy; Vacuum systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5982-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.2000.854724
  • Filename
    854724