DocumentCode
2202389
Title
Information theory based design of phase-change memories
Author
Franceschini, Michele ; Lastras-Montaño, L.A. ; Karidis, John P. ; Jagmohan, Ashish
Author_Institution
IBM T. J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2010
fDate
Jan. 31 2010-Feb. 5 2010
Firstpage
1
Lastpage
7
Abstract
Due to the high device density and the advent of multiple bits per cell, modern nonvolatile memories are characterized by a non-deterministic behavior. We focus on phase-change memory (PCM), whose memory cell can be seen as a programmable resistor, and use information theory tools to investigate how the cell structure influences the storage capacity of this memory technology. In particular, we numerically compute the storage capacity of two known cell structures, i.e., the series cell, and the parallel cell. The results suggest that, in practical scenarios, the parallel cell structure is characterized by significantly larger storage capacity.
Keywords
information theory; integrated circuit design; phase change memories; high device density; information theory based design; multiple bits per cell; nonvolatile memories; parallel cell structure; phase change memories; Amorphous materials; Crystalline materials; Crystallization; Electric resistance; Electrodes; Information theory; Material storage; Phase change materials; Phase change memory; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory and Applications Workshop (ITA), 2010
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-7012-9
Electronic_ISBN
978-1-4244-7014-3
Type
conf
DOI
10.1109/ITA.2010.5454135
Filename
5454135
Link To Document