Title :
Proceedings of the Eighth IEEE International On-Line Testing Workshop (IOLTW 2002)
Keywords :
automatic testing; built-in self test; embedded systems; error detection; fault diagnosis; fault tolerant computing; hardware-software codesign; integrated circuit testing; logic testing; BIST; analog testing; automotive systems; concurrent error detection; embedded memory; fault injection techniques; fault tolerant systems; hardware fault tolerance; hardware-software design; mixed signal testing; on-line testing; railway systems; reliability; self checking circuits;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Conference_Location :
Isle of Bendor, France
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030174
