Title :
The deposition of ultra nanocrystalline diamond films using a Ar/H/sub 2//CH/sub 4/ microwave discharge
Author :
Huang, W.S. ; Asmussen, J. ; Wright, B. ; Krauss, A.R. ; Gruen, D.M. ; Sumant, A.
Author_Institution :
Dept. of Electr. Comput. Eng., Michigan State Univ., East Lansing, MI, USA
Abstract :
Summary form only given. During the past ten years, plasma assisted chemical deposition of diamond thin films has been extensively investigated by many research groups. These experimental investigations have shown that diamond films can be synthesized from heated or ionized H/sub 2//CH/sub 4/ gas mixtures. The synthesized films result in a columnar growth texture with rough surface; i.e. the films are polycrystalline. This surface roughness usually prevents these films from being used in many wear and cutting tool applications. Thus, it is desirable to develop new methods to synthesize small crystalline and smooth diamond films. This investigation presents the experimental results concerned with the development of a new method of synthesizing smooth, ultra-nanocrystalline films. Building upon the experimental results of Gruen (Zhou et al., 1998), microwave plasma assisted film deposition is investigated using carbon containing Ar plasma. Experiments are performed with a MSU developed microwave plasma reactor. In this investigation the dominant input gas is argon. CH/sub 4/ concentrations are less than 3% and H/sub 2/ concentrations are limited to less than 6% of the total input gases.
Keywords :
diamond; high-frequency discharges; nanostructured materials; plasma CVD; plasma flow; plasma impurities; plasma pressure; thin films; 100 to 160 torr; 600 to 900 C; 700 to 2000 W; Ar/H/sub 2//methane microwave discharge; H/sub 2/ concentrations; carbon containing Ar plasma; columnar growth texture; cutting tool; diamond deposition; input gas; methane concentrations; methane gas mixtures; microwave plasma assisted film deposition; microwave plasma reactor; polycrystalline films; rough surface; small crystalline films; smooth ultra-nanocrystalline films; surface roughness; ultra nanocrystalline diamond films; wear; Argon; Chemicals; Crystallization; Cutting tools; Electromagnetic heating; Plasma chemistry; Rough surfaces; Sputtering; Surface roughness; Surface texture;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854741