• DocumentCode
    2202469
  • Title

    Concepts for secondary electron emission from irradiated insulators

  • Author

    Frederickson, A.R.

  • Author_Institution
    Phillips Lab., Hanscom AFB, MA, USA
  • Volume
    1
  • fYear
    1996
  • fDate
    21-26 Jul 1996
  • Firstpage
    517
  • Abstract
    Planar 1-dimensional samples of 2.815 mm thick polymethylmethacrylate (PMMA) were irradiated in vacuum by 1 MeV electrons at constant intensity under three conditions of electrode attachment. Electrodes were either painted on the surface or spaced in vacuum 6.3 mm from the surface. Currents to the electrodes were monitored during the irradiation. The radiation dose penetrating the insulator was also monitored. As the radiation proceeded, the insulators became charged and modified the depth of penetration of the 1 MeV electrons. A simulation code predicts the correct electrode currents and penetrating dose rate only if one allows the low energy secondary electron emission to be a strong function of the electric field just inside the insulator PMMA surface. Secondary emission is enhanced more than a factor of ten with the surfaces at 10 kV/cm
  • Keywords
    electric breakdown; electrodes; electron beam effects; insulator testing; organic insulating materials; polymers; secondary electron emission; surface charging; 1 MeV; 2.815 mm; 6.3 mm; PMMA; electric field; electrode attachment; electrode currents; insulator charging; irradiated insulators; penetrating dose rate; polymethylmethacrylate; radiation dose; secondary electron emission; simulation code; Dielectrics and electrical insulation; Electrodes; Electron emission; Geometry; Paints; Physics; Predictive models; Radiation monitoring; Space vehicles; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on
  • Conference_Location
    Berkeley, CA
  • Print_ISBN
    0-7803-2906-6
  • Type

    conf

  • DOI
    10.1109/DEIV.1996.545414
  • Filename
    545414