• DocumentCode
    2202530
  • Title

    A system level approach in designing dual-duplex fault tolerant embedded systems

  • Author

    Bolchini, C. ; Pomante, L. ; Salice, F. ; Sciuto, D.

  • Author_Institution
    Dipt. di Elettronica e Inf., Politecnico di Milano, Italy
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    32
  • Lastpage
    36
  • Abstract
    This paper presents an approach for designing embedded systems able to tolerate hardware faults, defined as an evolution of our previous work proposing an hardware/software co-design framework for realizing reliable embedded systems. The framework is extended to support the designer in achieving embedded systems with fault tolerant properties minimizing overheads and limiting power consumption. A reference system architecture is proposed; the specific hardware/software implementation and reliability methodologies (to achieve the fault tolerance properties) are the result of an enhanced hw/sw partitioning process driven by the designer´ constraints and by the reliability constraints, set at the beginning of the design process. By introducing also the reliability constraints during specification, the final system can benefit from the introduced redundancy also for performance gains, while limiting area, time, performance and power consumption overheads.
  • Keywords
    avionics; embedded systems; fault diagnosis; hardware-software codesign; redundancy; safety-critical software; software fault tolerance; dual-duplex fault tolerant systems; embedded systems design; enhanced partitioning; flexibility; hardware faults; hardware-software codesign; mission critical environments; modularity; on-line fault detection; performance gains; redundancy; reference system architecture; reliability methodologies; system level approach; target architecture definition; Computer architecture; Embedded software; Embedded system; Energy consumption; Fault tolerant systems; Hardware; Performance gain; Power system reliability; Process design; Redundancy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
  • Print_ISBN
    0-7695-1641-6
  • Type

    conf

  • DOI
    10.1109/OLT.2002.1030180
  • Filename
    1030180