• DocumentCode
    2202542
  • Title

    Development of a miniature cold-cathode electron gun

  • Author

    Menz, D.M. ; Velazco, J.E. ; Ceperley, P.H.

  • Author_Institution
    Microwave Technols. Inc., Fairfax, VA, USA
  • fYear
    2000
  • fDate
    4-7 June 2000
  • Firstpage
    123
  • Abstract
    Summary form only given, as follows. Microwave Technologies Incorporated is developing a miniature cold cathode electron gun (MCEG) prototype as a potential replacement for conventional thermionic cathodes. The MCEG employs Pierce-type geometry and uses microscopic silicon cathode for the generation of a good-quality high-current-density electron beam. We will report on a MCEG proof-of-principle experiment which is designed for the generation of a 5 kV, 50 mA electron beam. The status of our test bed assembly and of our data acquisition system will be presented. We will also report on the experimental emission testing of different field-emitter-array cathodes tested in our system. When compared to conventional thermionic electron guns, the MCEG offers a substantial reduction in size and weight and avoids the use of heating elements. The electron gun prototype under development has an immense number of applications such as the next generation of microwave tubes, electron microscopes, high-definition television, spectrometers, flat panel displays, as well as industrial and medical accelerators.
  • Keywords
    cold-cathode tubes; electron guns; microwave tubes; thermionic cathodes; vacuum microelectronics; Pierce-type geometry; data acquisition system; electron microscopy; field-emitter-array cathodes; flat panel displays; good-quality high-current-density electron beam generation; high-definition television; industrial accelerators; medical accelerators; microscopic Si cathode; microwave tubes; miniature cold-cathode electron gun; test bed assembly; thermionic cathodes; thermionic electron guns; Assembly systems; Cathodes; Electromagnetic heating; Electron beams; Electron microscopy; Geometry; Microwave technology; Prototypes; Silicon; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5982-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.2000.854746
  • Filename
    854746