DocumentCode
2202558
Title
On the improved path metric for soft-input soft-output tree detection
Author
Choi, Jun Won ; Shim, Byonghyo ; Singer, Andrew C.
Author_Institution
Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2010
fDate
Jan. 31 2010-Feb. 5 2010
Firstpage
1
Lastpage
5
Abstract
In this paper, we propose a new path metric, which improves the performance of soft-input soft-output (SISO) tree detection for iterative detection and decoding (IDD) systems. While the conventional path metric accounts for the contribution of symbols on a visited path due to the causal nature of tree search, the new path metric, called improved path metric, reflect the contribution of unvisited paths using an unconstrained minimum mean squared error (MMSE) estimate of undecided symbols. The improved path metric is applied to SISO M-algorithm, which finds a list of symbol candidates based on breadth-first search strategy and computes a posteriori probability of each entry of the symbol vector. We study the probability of correct path loss (CPL) for the improved path metric and confirm the performance improvement over the conventional path metric.
Keywords
information theory; iterative decoding; least mean squares methods; probability; trees (mathematics); CPL; IDD systems; MMSE estimation; SISO M-algorithm; SISO tree detection; a posteriori probability; breadth-first search strategy; correct path loss; improved path metric; iterative detection and decoding; minimum mean squared error; soft-input soft-output tree detection; symbol candidates; symbol vector; Bit error rate; Costs; Degradation; Detection algorithms; Detectors; Intersymbol interference; Iterative decoding; MIMO; Performance loss; Tail;
fLanguage
English
Publisher
ieee
Conference_Titel
Information Theory and Applications Workshop (ITA), 2010
Conference_Location
San Diego, CA
Print_ISBN
978-1-4244-7012-9
Electronic_ISBN
978-1-4244-7014-3
Type
conf
DOI
10.1109/ITA.2010.5454143
Filename
5454143
Link To Document