Title :
A ΣΔ A/D converter insensitive to SEU effects
Author :
Cortes, Fernando Paixão ; Carro, Luigi ; Girardi, Alessandro ; Suzim, Altamiro
Author_Institution :
Instituto de Informatica, Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
Abstract :
This paper discusses a ΣΔ A/D converter insensitive to SEU effects. We concentrated our first study in the analog part of the converter, proving that it is inherently immune to SEU. Afterwards, we studied several implementations of digital filters in order to minimize the cost of protecting the digital part against radiation effects. The use of the δ-operator allows a significant reduction on the area to be protected, while maintaining converter performance. The obtained simulation results showed that the ΣΔ architecture provides excellent possibilities to build SEU immune AD converters.
Keywords :
CMOS integrated circuits; FIR filters; IIR filters; VLSI; circuit CAD; digital filters; equivalent circuits; low-pass filters; radiation hardening (electronics); sigma-delta modulation; CMOS VLSI; FIR filter implementation; IIR filters; Matlab model; SEU effects; decimation filter; delta-operator; digital filters; discrete-time equivalent circuit; low-pass filter; radiation effects; shift operator; sigma delta converter ADC; sigma-delta quantizer; Analog-digital conversion; CMOS technology; Circuits; Delta-sigma modulation; Digital filters; Mathematical model; Protection; Radiation effects; Single event upset; Very large scale integration;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030189
