A BICS for CMOS opamps by monitoring the supply current peak

Author

Font, J. ; Ginard, J. ; Isern, E. ; Roca, M. ; Segura, J. ; García, E.

Author_Institution

Dept. de Fisica, Univ. de les Illes Baleares, Palma de Mallorca, Spain

fYear

2002

fDate

2002

Firstpage

94

Lastpage

98

Abstract

We present a Built-In-Current-Sensor (BICS) based on monitoring the supply current peak of CMOS opamps using the oscillation-test-strategy. The BICS takes a weighed sample of the current through each opamp current branch and monitors the peak value under oscillation. An envelope detector and additional digital circuitry is used to provide a pass/fail flag. Simulation results demonstrate a high defect coverage with a very small impact on the opamp nominal operation.

Keywords

CMOS analogue integrated circuits; built-in self test; current mirrors; electric current measurement; integrated circuit testing; operational amplifiers; CMOS op amps; built-in-current-sensor; compensated two-stage op amps; current measurement; current mirrors; current signature compressor; envelope detector; fault coverage; high defect coverage; low area overhead; mixed-signal circuit; oscillation-test-strategy; supply current peak monitoring; Circuit faults; Circuit testing; Current measurement; Current supplies; Envelope detectors; Feedback; Mirrors; Monitoring; Oscillators; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International

Print_ISBN

0-7695-1641-6

Type

conf

DOI

10.1109/OLT.2002.1030190

Filename

1030190