Title :
On-line detection of short circuits in digital devices and systems
Author_Institution :
Silesian Univ. of Technol., Gliwice, Poland
Abstract :
Presented method of on-line detection of overloads and short circuits in digital devices and systems is based on inexpensive overload detectors built into integrated circuits. A prototype 0.8 μm CMOS ASIC successfully verifies this method.
Keywords :
CMOS digital integrated circuits; application specific integrated circuits; built-in self test; integrated circuit interconnections; integrated circuit testing; short-circuit currents; CMOS ASIC; built-in detectors; digital devices; digital systems; fault insertion; interconnection faults; on-line detection; overloads; short circuits; Application specific integrated circuits; Bidirectional control; Circuit faults; Circuit testing; Conferences; Detectors; Digital integrated circuits; Integrated circuit interconnections; Libraries; Prototypes;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030207
