• DocumentCode
    2203196
  • Title

    Nanotip GaN pyramids formed by polarity-selective chemical etching

  • Author

    Ng, Hock M. ; Weimann, Nils G. ; Chowdhury, Aref ; Shaw, Jonathan

  • Author_Institution
    Lucent Technol. Bell Labs., Murray Hill, NJ, USA
  • fYear
    2003
  • fDate
    25-27 Aug. 2003
  • Firstpage
    31
  • Lastpage
    32
  • Abstract
    In this paper we have systematically studied the chemical etching of Ga and N-polar GaN with KOH, varying as a parameter either the concentration or the temperature of the solution for a fixed etch duration. The growth polarity can be controlled by the deposition of an appropriate buffer layer during molecular beam epitaxy (MBE). Using a patterned template, we grown samples with adjacent Ga-and N-polar regions. The N-polar GaN was found to be selectively etched while the Ga-polar GaN remained intact. We have made preliminary measurements of electron field emission from the GaN nanotip pyramids. Anode was suspended 50-500μm above the film and I-V measurements were made at 50μm increments.
  • Keywords
    III-V semiconductors; electron field emission; etching; gallium compounds; molecular beam epitaxial growth; nanostructured materials; semiconductor epitaxial layers; semiconductor growth; surface chemistry; wide band gap semiconductors; 50 to 500 micron; GaN; MBE; anode; buffer layer; electron field emission; molecular beam epitaxy; nanotip GaN pyramids; polarity-selective chemical etching; solution concentration; solution temperature; thin film; Anodes; Bonding; Chemical technology; Dry etching; Gallium nitride; Laboratories; Molecular beam epitaxial growth; Photonic band gap; Stability; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Compound Semiconductors, 2003. International Symposium on
  • Print_ISBN
    0-7803-7820-2
  • Type

    conf

  • DOI
    10.1109/ISCS.2003.1239891
  • Filename
    1239891