DocumentCode :
2203196
Title :
Nanotip GaN pyramids formed by polarity-selective chemical etching
Author :
Ng, Hock M. ; Weimann, Nils G. ; Chowdhury, Aref ; Shaw, Jonathan
Author_Institution :
Lucent Technol. Bell Labs., Murray Hill, NJ, USA
fYear :
2003
fDate :
25-27 Aug. 2003
Firstpage :
31
Lastpage :
32
Abstract :
In this paper we have systematically studied the chemical etching of Ga and N-polar GaN with KOH, varying as a parameter either the concentration or the temperature of the solution for a fixed etch duration. The growth polarity can be controlled by the deposition of an appropriate buffer layer during molecular beam epitaxy (MBE). Using a patterned template, we grown samples with adjacent Ga-and N-polar regions. The N-polar GaN was found to be selectively etched while the Ga-polar GaN remained intact. We have made preliminary measurements of electron field emission from the GaN nanotip pyramids. Anode was suspended 50-500μm above the film and I-V measurements were made at 50μm increments.
Keywords :
III-V semiconductors; electron field emission; etching; gallium compounds; molecular beam epitaxial growth; nanostructured materials; semiconductor epitaxial layers; semiconductor growth; surface chemistry; wide band gap semiconductors; 50 to 500 micron; GaN; MBE; anode; buffer layer; electron field emission; molecular beam epitaxy; nanotip GaN pyramids; polarity-selective chemical etching; solution concentration; solution temperature; thin film; Anodes; Bonding; Chemical technology; Dry etching; Gallium nitride; Laboratories; Molecular beam epitaxial growth; Photonic band gap; Stability; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Compound Semiconductors, 2003. International Symposium on
Print_ISBN :
0-7803-7820-2
Type :
conf
DOI :
10.1109/ISCS.2003.1239891
Filename :
1239891
Link To Document :
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