DocumentCode
2203229
Title
Digest of Papers 1996 IEEE International Workshop on IDDQ Testing [Author Index]
fYear
1996
fDate
24-25 Oct. 1996
Firstpage
105
Abstract
Lists the index of authors from the conference proceedings.
Keywords
CMOS integrated circuits; automatic testing; electric current measurement; integrated circuit testing; leakage currents; logic testing; production testing; ATPG; CMOS ICs; IC testing; IDDQ testing; current sensors; test generation; testability;
fLanguage
English
Publisher
ieee
Conference_Titel
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location
Washington, DC, USA
Print_ISBN
0-8186-7655-8
Type
conf
DOI
10.1109/IDDQ.1996.557842
Filename
557842
Link To Document