Title :
Digest of Papers 1996 IEEE International Workshop on IDDQ Testing [Author Index]
Abstract :
Lists the index of authors from the conference proceedings.
Keywords :
CMOS integrated circuits; automatic testing; electric current measurement; integrated circuit testing; leakage currents; logic testing; production testing; ATPG; CMOS ICs; IC testing; IDDQ testing; current sensors; test generation; testability;
Conference_Titel :
IDDQ Testing, 1996., IEEE International Workshop on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-8186-7655-8
DOI :
10.1109/IDDQ.1996.557842
