Title :
Error rate estimation for a flight application using the CEU fault injection approach
Author :
Kaddour, F. ; Rezgui, S. ; Velazco, R. ; Rodriguez, S. ; De Mingo, J.R.
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
This paper aims at validating the efficiency of a fault injection approach to predict error rate on applications devoted to operate in radiation environment. Soft error injection experiments and radiation ground testing were performed on software modules using a digital board built on a digital signal processor which is included in a satellite instrument. The analysis of experimental results put in evidence the potentialities offered by the used methodology to predict the error rate of complex applications.
Keywords :
digital signal processing chips; fault simulation; integrated circuit testing; radiation hardening (electronics); space vehicle electronics; bit flips injection; code emulating an upset approach; digital signal processor; error rate estimation; fault injection; flight application; radiation environment; radiation ground testing; satellite instrument; single event upsets; soft error injection; software modules; Application software; Circuit faults; Circuit testing; Digital signal processors; Error analysis; Estimation error; Integrated circuit testing; Performance evaluation; Satellites; Single event upset;
Conference_Titel :
On-Line Testing Workshop, 2002. Proceedings of the Eighth IEEE International
Print_ISBN :
0-7695-1641-6
DOI :
10.1109/OLT.2002.1030218
