Title :
Measurements of the structural evolution of X pinches and the formation of radiating hot spots
Author :
Pikuz, S.A. ; Shelkovenko, T.A. ; Sinars, D.B. ; Hammer, D.A. ; Chandler, K.M. ; Min Hu
Author_Institution :
Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
Abstract :
Summary form only given. In previous work on the X pinch (XP) facility (470 kA, 100 ns), we found that an on-axis z pinch forms in the cross point region during the final few ns prior to the radiation bursts. The rapid collapse of the z pinch results in a gap in the observable mass distribution, which we refer to as a minidiode. Improved measurements of the collapse of this z pinch have been made, allowing more reliable estimates of the pinch velocities prior to the radiation burst, and the expansion velocities after the radiation burst. We have also observed "self-similar" structure in different stages of the z pinch collapse. In addition, the source of the radiation bursts was localized to within 10 microns within the observed z pinch structure using a technique reported during ICOPS 1999. Using three X pinches to backlight one another, two images of each X pinch can be obtained. Thus, the hot spot of one of the X pinches and the z-pinch structure both prior to and after its radiation burst can be determined. These results should enable us to better understand the role of the X-ray source in the dynamics of the X pinch.
Keywords :
Z pinch; pinch effect; plasma diodes; 100 ns; 470 kA; X pinch; X pinches; backlighting; cross point region; expansion velocities; hot spot; mass distribution; minidiode; on-axis z pinch; pinch velocities; radiating hot spots; radiation burst; radiation bursts; self-similar structure; structural evolution; z pinch collapse; z pinch structure; Plasma measurements; Plasma temperature; Plasma x-ray sources; Reflection; Shape; Spectroscopy; US Department of Energy; Velocity measurement; Wires; X-ray imaging;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854790