• DocumentCode
    2203684
  • Title

    Study of the rapid expansion rates of 25 /spl mu/m Ag, Au, and Cu wires driven by a current rise rate of 10/sup 10/ A/s for <100 ns

  • Author

    Chandler, K.M. ; Min Hu ; Sinars, D.B. ; Shelkovenko, T.A. ; Pikuz, S.A. ; Greenly, J.B. ; Hammer, D.A. ; Kusse, B.R.

  • Author_Institution
    Lab. of Plasma Studies, Cornell Univ., Ithaca, NY, USA
  • fYear
    2000
  • fDate
    4-7 June 2000
  • Firstpage
    139
  • Abstract
    Summary form only given. Investigations of the expansion rates of exploding wires composed of many different materials are in progress using a pulsed current source with a rise rate of 10/sup 10/ A/s per wire. This range is similar to the prepulse phase of wire-array experiments on the Saturn and Z accelerators at Sandia National Laboratories in Albuquerque, NM. Materials investigated include Ag, Al, Au, Cu, Mo, Ni, Pd, Pt, Ti, W, Zn, stainless steel, and others. Under identical pulser parameters, Ag, Au, and Cu wires exhibit among the fastest expansion rates and most uniform wire explosions of all the materials studied. The characteristics of Ag, Au, and Cu wire explosions will be discussed, including the effects of insulating coatings (Sinars et al., 2000). Comparisons will be made to materials from nearby columns on the periodic table, such as Ni and Pt.
  • Keywords
    copper; exploding wires; gold; pinch effect; plasma diagnostics; silver; thermal expansion; Ag; Ag wires; Al; Au; Au wires; Cu; Cu wires; Mo; Ni; Pd; Pt; Saturn accelerators; Ti; W; X pinch; X-ray backlighters; XP pulser; Z accelerators; Zn; current rise rate; exploding wires; insulating coatings; optical interferometry; plasma diagnostics; prepulse phase; pulsed current source; rapid expansion rates; schlieren systems; stainless steel; wire explosions; wire-array experiments; Building materials; Cable insulation; Coatings; Explosions; Gold; Laboratories; Saturn; Steel; Wires; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
  • Conference_Location
    New Orleans, LA, USA
  • ISSN
    0730-9244
  • Print_ISBN
    0-7803-5982-8
  • Type

    conf

  • DOI
    10.1109/PLASMA.2000.854793
  • Filename
    854793