Title :
Wavelet transform domain adaptive clustering for electronic product quality inspection
Author :
Shcherbakova, Galina ; Krylov, V. ; Pisarenko, Radmila ; Kuzmenko, Vadym
Author_Institution :
Odessa Nat. Polytech. Univ., Odessa, Ukraine
Abstract :
Wavelet transform (WT) domain adaptive clustering for electronic product quality inspection was suggested in this work. The proposed information technology, based on the multistart adaptive clustering method in the space of the WT, can shorten manufacturing test of products in case of a significant change in these parameters over time, a high noise level and small samples of data.
Keywords :
inspection; pattern clustering; product quality; production engineering computing; wavelet transforms; electronic product quality inspection; high noise level; information technology; multistart adaptive clustering method; product manufacturing test; wavelet transform domain adaptive clustering; Clustering methods; Manufacturing; Noise; Parameter estimation; Resistors; Standards; Time measurement; clustering; sub gradient; wavelet transfor domain;
Conference_Titel :
Intelligent Data Acquisition and Advanced Computing Systems (IDAACS), 2013 IEEE 7th International Conference on
Conference_Location :
Berlin
Print_ISBN :
978-1-4799-1426-5
DOI :
10.1109/IDAACS.2013.6662660
