Research of through breakdown dielectric envelope in vacuum and gas-discharge electronic tubes with the operating voltage 50-300 kV

Author

Bochkov, V.D. ; Pogorelsky, M.M.

Author_Institution

Res. Inst. of Gas-Discharge Devices-Plasma, Ryazan, Russia

Volume

1

fYear

1996

fDate

21-26 Jul 1996

Firstpage

548

Abstract

Work has been carried out in Russia to investigate processes that influence the decrease of dielectric strength of electronic devices with operating voltages between 50-300 kV. Particular attention has been given to investigation of processes that are responsible for the through breakdown of the dielectric envelope which leads to loss of hermetic seal of tubes. On the basis of this research work and of the analysis of the charge processes on the dielectric surface, a mechanism of envelope breakdown was proposed and verified experimentally

Keywords

electric breakdown; electric strength; gas-discharge tubes; seals (stoppers); surface charging; vacuum breakdown; vacuum insulation; vacuum tubes; 50 to 300 kV; dielectric breakdown envelope; dielectric strength; dielectric surface charge processes; gas-discharge electronic tubes; hermetic seal loss; vacuum electronic tubes; Dielectric breakdown; Dielectric losses; Electric breakdown; Electrodes; Electron tubes; Glass; Oil insulation; Thyratrons; Vacuum breakdown; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Discharges and Electrical Insulation in Vacuum, 1996. Proceedings. ISDEIV., XVIIth International Symposium on

Conference_Location

Berkeley, CA

Print_ISBN

0-7803-2906-6

Type

conf

DOI

10.1109/DEIV.1996.545421

Filename

545421