DocumentCode :
2204217
Title :
Diagnostics of dynamic behaviors of excited atoms in microplasmas for plasma display panels
Author :
Tachibana, K.
Author_Institution :
Dept. of Electron. Sci. & Eng., Kyoto Univ., Japan
fYear :
2002
fDate :
26-30 May 2002
Firstpage :
100
Abstract :
Summary form only given, as follows. We developed a microscopic laser-absorption method for the absolute measurement of excited Xe(1S/sub 4/, 1s/sub 5/) atoms, which lead to VUV emissions for the excitation of RGB phosphors, with a spatial and temporal resolution of 20 /spl mu/m and 5 ns, respectively. For the measurement of higher lying excited Xe(2p) atoms and Ne(2p) atoms, the corresponding near IR and visible emissions were observed by a gated CCD camera equipped with appropriate optical band pass filters. For the simultaneous front and side view observations, we constructed a special panel, which had a realistic AC-type cell structure and sizes.
Keywords :
brightness; excited states; luminescence; plasma diagnostics; plasma displays; xenon; AC-type cell structure; RGB phosphors; VUV emissions; Xe; absolute measurement; dynamic behavior diagnostics; excited atoms in microplasmas; higher lying excited atoms; luminous efficiency; microscopic laser-absorption method; near IR emissions; operating parameters; plasma display panels; spatial resolution; temporal resolution; transparent glass prisms; visible emissions; Atom lasers; Atom optics; Atomic beams; Atomic measurements; Laser excitation; Microscopy; Phosphors; Plasma displays; Plasma measurements; Spatial resolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2002. ICOPS 2002. IEEE Conference Record - Abstracts. The 29th IEEE International Conference on
Conference_Location :
Banff, Alberta, Canada
Print_ISBN :
0-7803-7407-X
Type :
conf
DOI :
10.1109/PLASMA.2002.1030249
Filename :
1030249
Link To Document :
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