DocumentCode
2204284
Title
Modeling and Simulation of a Resistive Thermal Probe
Author
Min, Dong-Ki ; Hong, Seungbum
Author_Institution
SAIT, Yongin
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
320
Lastpage
324
Abstract
Resistive probe can detect the variation of electric field from a media by its current variation. Equivalently it is a variable resistor, which is sensitive to electric field. However, the experimental results show that another mechanism is involved in it and it is considered to have a relationship with the topography of the media. In this paper, this newly observed mechanism is explained as thermal effect with simulation results. This can affect the signal quality as a noise source or detection limitation of the field variation or, in other hand can be used as a highly localized thermal tip sensor.
Keywords
digital storage; electric field measurement; microsensors; probes; resistance thermometers; temperature measurement; detection limitation; field variation; localized thermal tip sensor; noise source; resistive thermal probe; signal quality; thermal effect; Atomic force microscopy; Electric resistance; Ferroelectric materials; Resistors; Scanning probe microscopy; Semiconductor devices; Semiconductor materials; Surface resistance; Surface topography; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2007 IEEE
Conference_Location
Atlanta, GA
ISSN
1930-0395
Print_ISBN
978-1-4244-1261-7
Electronic_ISBN
1930-0395
Type
conf
DOI
10.1109/ICSENS.2007.4388401
Filename
4388401
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