• DocumentCode
    2204284
  • Title

    Modeling and Simulation of a Resistive Thermal Probe

  • Author

    Min, Dong-Ki ; Hong, Seungbum

  • Author_Institution
    SAIT, Yongin
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    320
  • Lastpage
    324
  • Abstract
    Resistive probe can detect the variation of electric field from a media by its current variation. Equivalently it is a variable resistor, which is sensitive to electric field. However, the experimental results show that another mechanism is involved in it and it is considered to have a relationship with the topography of the media. In this paper, this newly observed mechanism is explained as thermal effect with simulation results. This can affect the signal quality as a noise source or detection limitation of the field variation or, in other hand can be used as a highly localized thermal tip sensor.
  • Keywords
    digital storage; electric field measurement; microsensors; probes; resistance thermometers; temperature measurement; detection limitation; field variation; localized thermal tip sensor; noise source; resistive thermal probe; signal quality; thermal effect; Atomic force microscopy; Electric resistance; Ferroelectric materials; Resistors; Scanning probe microscopy; Semiconductor devices; Semiconductor materials; Surface resistance; Surface topography; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2007 IEEE
  • Conference_Location
    Atlanta, GA
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-1261-7
  • Electronic_ISBN
    1930-0395
  • Type

    conf

  • DOI
    10.1109/ICSENS.2007.4388401
  • Filename
    4388401