Title :
Modeling and Simulation of a Resistive Thermal Probe
Author :
Min, Dong-Ki ; Hong, Seungbum
Author_Institution :
SAIT, Yongin
Abstract :
Resistive probe can detect the variation of electric field from a media by its current variation. Equivalently it is a variable resistor, which is sensitive to electric field. However, the experimental results show that another mechanism is involved in it and it is considered to have a relationship with the topography of the media. In this paper, this newly observed mechanism is explained as thermal effect with simulation results. This can affect the signal quality as a noise source or detection limitation of the field variation or, in other hand can be used as a highly localized thermal tip sensor.
Keywords :
digital storage; electric field measurement; microsensors; probes; resistance thermometers; temperature measurement; detection limitation; field variation; localized thermal tip sensor; noise source; resistive thermal probe; signal quality; thermal effect; Atomic force microscopy; Electric resistance; Ferroelectric materials; Resistors; Scanning probe microscopy; Semiconductor devices; Semiconductor materials; Surface resistance; Surface topography; Thermal resistance;
Conference_Titel :
Sensors, 2007 IEEE
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-1261-7
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.4388401