Title :
Enhanced corona discharge: I-V characterization and ion density measurements
Author :
Kang, W.L. ; Alexeff, I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Tennessee Univ., Knoxville, TN, USA
Abstract :
Summary form only given, as follows. Attachment of electrons to the oxygen molecules can be a problem for corona discharge at atmospheric pressure in air. We have found a way to enhance the discharge by reducing or avoiding the attachment. The enhancement is achieved by replacing the air around the limited corona points with non-electronegative gases such as argon, helium, and nitrogen as shown in the figure below. The configuration of such electrode is made of a line of pins fastened to a brass pipe at one end and protrudes from the other end through tiny holes. The feed gas escapes through the holes and provides a local atmosphere around the corona points. By proper biasing a pair of such electrodes separated by a distance, we are able to produce both positive and negative ions that migrate into the bulk plasma to overcome the previous density limitation that occurred because of space charge in a single species corona discharge. We will present the I-V characteristics, the local ion density measurement and the spatial ion density profile of our enhanced corona discharge apparatus. Ozone detection will also be discussed.
Keywords :
corona; ion density; plasma density; plasma diagnostics; Ar; He; I-V characterization; N/sub 2/; O/sub 2/; O/sub 2/ molecules; O/sub 3/; air; atmospheric pressure; brass pipe; corona discharge; corona points; density limitation; electron attachment; enhanced corona discharge; enhanced corona discharge apparatus; feed gas; ion density measurements; limited corona points; local ion density measurement; nonelectronegative gases; ozone detection; single species corona discharge; spatial ion density profile; Argon; Atmosphere; Corona; Electrodes; Electrons; Feeds; Gases; Helium; Nitrogen; Pins;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854823