Title :
Large area plasma processing system based on electron beam ionization
Author :
Leonhardt, D. ; Walton, S.G. ; Blackwell, D.B. ; Murphy, D.P. ; Fernsler, R.F. ; Meger, R.A.
Author_Institution :
Div. of Plasma Phys., Naval Res. Lab., Washington, DC, USA
Abstract :
Summary form only given. Electron beam ionization is both efficient at producing plasma and scalable to large area (square meters) with beam energy and density. A ´Large Area Plasma Processing System´ has been developed based on the beam ionization process, with the goal of modifying the surface properties of materials over large areas. The system consists of a planar plasma distribution generated by a magnetically collimated sheet of 2-5 kV, /spl sim/10 mA/cm/sup 2/ electrons injected into a neutral gas background (oxygen, nitrogen, argon, neon). Beam ionization largely decouples plasma production from the reactor chamber, and ion densities of up to 5/spl times/10/sup 12/ cm/sup -3/ in large volumes (2 cm/spl times/60 cm/spl times/60 cm) have been produced in dielectric as well as conducting chambers. Typical operating pressures range from 20-200 mtorr with beam-collimating magnetic fields strengths of 10-300 Gauss. Thus far, electron beams have been produced using pulsed (10-4000 /spl mu/s pulse length, >50% duty cycle) and DC hollow cathode discharges. Temporally resolved plasma characteristics deduced from Langmuir probes, optical emission spectroscopy and microwave interferometry will be presented for noble and molecular gases. Similarly, temporally resolved plasma-to-surface fluxes (via mass spectrometry) and their energy distributions will be presented to give further insight into LAPPS for material processing applications.
Keywords :
Langmuir probes; electron impact ionisation; plasma diagnostics; plasma materials processing; plasma pressure; plasma production; 10 to 300 G; 10 to 4000 mus; 2 cm; 2.5 kV; 20 to 200 mtorr; 60 cm; DC hollow cathode discharges; Langmuir probes; beam energy; beam ionization; beam-collimating magnetic field strengths; conducting chambers; density; dielectric chambers; duty cycle; electron beam ionization; electron beams; energy distributions; ion densities; large area plasma processing system; magnetically collimated sheet; mass spectrometry; material processing applications; microwave interferometry; molecular gases; neutral gas background; noble gases; operating pressure; optical emission spectroscopy; planar plasma distribution; plasma production; pulse length; pulsed hollow cathode discharge; reactor chamber; scaling; surface properties; temporally resolved plasma-to-surface fluxes; Electron beams; Energy resolution; Ion beams; Ionization; Optical pulses; Particle beams; Plasma applications; Plasma density; Plasma materials processing; Plasma properties;
Conference_Titel :
Plasma Science, 2000. ICOPS 2000. IEEE Conference Record - Abstracts. The 27th IEEE International Conference on
Conference_Location :
New Orleans, LA, USA
Print_ISBN :
0-7803-5982-8
DOI :
10.1109/PLASMA.2000.854828