Title :
Variable Mapping Method With Nonmatching Meshes in 3-D Finite-Element Analysis of Coupled Electromagnetic–Structural Fields
Author :
Yujiao Zhang ; Weinan Qin ; Jiangjun Ruan
Author_Institution :
Coll. of Electr. Eng. & New Energy, China Three Gorges Univ., Yichang, China
Abstract :
In the magnetic-structural simulations which are done by weak coupling, electromagnetic force data obtained by the simulation of the magnetic fields are to be transferred to the structural fields between meshes. However, in the different fields due to the different requirements of discretization scheme, such as the shape and distribution density of meshes, different finite-element models are used to analyze. Therefore, the data cannot directly be transferred between these nonmatching meshes. In this paper, we proposed a nonmatching meshes mapping method to deal with this problem. This method was used to a 3-D coupled magnetic and structural finite-element analysis of C-shaped armature in the railgun. Under the four different conditions of discretization scheme, the coupled simulations of the magnetic and structural fields were done by this method. The results were compared with reference values obtained by the same meshes mapping situation. The relative errors of the four cases are all less than 5%. Therefore, it proves the correctness and accuracy of this method.
Keywords :
electromagnetic fields; electromagnetic forces; finite element analysis; magnetic fields; railguns; 3D finite-element analysis; C-shaped armature; coupled magnetic analysis; discretization scheme; distribution density; electromagnetic force data; electromagnetic-structural fields; magnetic-structural simulations; nonmatching meshes; railgun; reference values; relative errors; shape; structural FEA; variable mapping method; Couplings; Data transfer; Force; Magnetic analysis; Magnetomechanical effects; Strain; Stress; Error analysis; magnetic-structural simulations; magnetic???structural simulations; nonmatching meshes mapping; weak coupling; weak coupling.;
Journal_Title :
Plasma Science, IEEE Transactions on
DOI :
10.1109/TPS.2015.2418051